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Results 1 to 25 of 5743

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Metal binding property of chitosan from different sourcesRAMACHANDRAN NAIR, K; MADHAVAN, P.Chiting and Chitosan. 2 Proceedings. 1982, pp 187-190Conference Paper

Bondability, reliability and yield benchmarks for high volume specialty gold fine bonding wireLICHTENBERGER, Heiner; ZASOWSKI, Michael; LOVITZ, Gery et al.SPIE proceedings series. 2003, pp 292-297, isbn 0-8194-5189-4, 6 p.Conference Paper

Morphology of ball bonds at <50μm pitchLEVINE, Lee; BRUNNER, Jon; SCHULZE, Gary W et al.SPIE proceedings series. 2003, pp 141-144, isbn 0-8194-5189-4, 4 p.Conference Paper

Power surge boosts seized metal bondingSHELLEY, T.Eureka (Beckenham). 1993, Vol 13, Num 12, pp 20-21, issn 0261-2097Article

CONVERGENCE OF MULTIBODY EXPANSIONS FOR ALKALINE EARTH METALS. CONTRAST BETWEEN MAGNESIUM AND BERYLLIUM CLUSTERSDAUDEY JP; KOLOS W; NOVARO O et al.1979; J. CHEM. PHYS.; USA; DA. 1979-12-01; VOL. 71; NO 11; PP. 4297-4303; BIBL. 22 REF.Article

FORMULES CHIMIQUES DES COMPOSES INTERMETALLIQUESKAZITSYN NV; YURKOV VA.1977; ZH. FIZ. KHIM.; S.S.S.R.; DA. 1977; VOL. 51; NO 11; PP. 2807-2809; BIBL. 12 REF.Article

Tantalum carbide and nitride diffusion barriers for Cu metallisationLAURILA, T; ZENG, K; KIVILAHTI, J. K et al.Microelectronic engineering. 2002, Vol 60, Num 1-2, pp 71-80, issn 0167-9317Conference Paper

Electromigration resistance of sputtered silver lines using different patterning techniquesHAUDER, M; HANSCH, W; GSTÖTTNER, J et al.Microelectronic engineering. 2002, Vol 60, Num 1-2, pp 51-57, issn 0167-9317Conference Paper

ON THE BINDING IN TWO-COMPONENT BERYLLIUM COMPOUNDSSCHUBERT K.1982; Z. METALLKD.; ISSN 0044-3093; DEU; DA. 1982-06; VOL. 73; NO 6; PP. 403-408; BIBL. 22 REF.Article

CRYSTAL STRUCTURE OF PD13PB9.RMAYER HW; ELLNER M; SCHUBERT K et al.1980; J. LESS-COMMON MET.; CHE; DA. 1980-06; VOL. 71; NO 2; PP. P29-P38; BIBL. 10 REF.Article

ELEKTRONEN-MIKROSKOPISCHE UNTERSUCHUNGEN ZUM BINDEMECHANISMUS BEIM KALTPRESSSCHWEISSEN. = EXAMENS AU MICROSCOPE ELECTRONIQUE DU MECANISME DE LIAISON LORS DU SOUDAGE PAR PRESSION A FROIDKREYE H; THOMAS K.1977; SCHWEISSEN U. SCHNEIDEN; DTSCH.; DA. 1977; VOL. 29; NO 7; PP. 249-252; ABS. ANGL. FR.; BIBL. 20 REF.Article

THEORETISCHE GRUNDLAGEN DES DIFFUSIONSSCHWEISSENS UND SCHLUSSFOLGERUNGEN FUER DIE ANWENDUNG = THEORETICAL FUNDAMENTALS OF DIFFUSION WELDING APPLICATIONS = PRINCIPES FONDAMENTAUX DU SOUDAGE PAR DIFFUSION ET CONCLUSIONS RELATIVES A L'UTILISATION DU PROCEDEMEHLHORN H.1983; SCHWEISSTECHNIK; ISSN 0036-7192; DDR; DA. 1983; VOL. 33; NO 1; PP. 24-27; BIBL. 11 REF.; LOC. ISArticle

CONSIDERATIONS ON THE BULK MODULUS OF PURE METALSSIEBKE W.1981; PHYS. STATUS SOLIDI, SECT. A, APPL. RES.; DDR; DA. 1981-04-16; VOL. 64; NO 2; PP. 577-583; BIBL. 24 REF.Article

PAIR-CORRELATION INTERPRETATION OF FREE ENERGY OF MIXING-APPLICATION TO SOME ALLOYS = INTERPRETATION PAR CORRELATION DE PAIRES DE L'ENERGIE LIBRE DE MELANGE. APPLICATION A QUELQUES ALLIAGESLERIBAUX H.1980; HIGH TEMP. HIGH PRESS.; ISSN 0018-1544; GBR; DA. 1980; VOL. 12; NO 5; PP. 495-502; BIBL. 19 REF.Article

METALLIC BOND EFFECTS ON MEAN EXCITATION ENERGIES FOR STOPPING POWERSWILSON JW; XU YJ.1982; PHYS. LETT. SECT. A; ISSN 0375-9601; NLD; DA. 1982; VOL. 90; NO 5; PP. 253-255; BIBL. 15 REF.Article

A STUDY OF GOLD-COPPER ALLOYS BY X-RAY ABSORPTION SPECTROSCOPYLOKHANDE NR; MANDE C.1980; PHYS. STATUS SOLIDI, SECT. B, BASIC RES.; DDR; DA. 1980-11-01; VOL. 102; NO 1; PP. K11-K14; BIBL. 14 REF.Article

MASS TRANSFERT PROCESSES IN DIFFUSIONAL BOND COMPOSITE MATERIALSKRISHTAL MA; GONCHAROV VS; SHTEJN LM et al.1979; FIZ. KHIM., OBRAB. MATER.; ISSN 0015-3214; SUN; DA. 1979; NO 6; PP. 129-132; BIBL. 2 REF.Article

A general sharing coefficient for the classification of structures with defined polyhedron complexesENGEL, N.Acta crystallographica. Section B, Structural science. 1991, Vol 47, Num 2, pp 217-224, issn 0108-7681, 8 p.Article

Bond weakening by hydrogen in transition metals = Affaiblissement des liaisons par l'hydrogène dans les métaux de transitionMCMULLEN, T; STOTT, M. J; ZAREMBA, E et al.Physical review. B, Condensed matter. 1987, Vol 35, Num 3, pp 1076-1081, issn 0163-1829Article

Resistance monitoring vehicle for advanced copper process technologyDE JONG, J. L; HSUEH, I.-Chin Emily; LY NGUYEN, Leon et al.International Symposium on the Physical & Failure Analysis of Integrated Circuits. 2004, pp 37-39, isbn 0-7803-8454-7, 1Vol, 3 p.Conference Paper

Termodynamika związków międzymetalicznych = Thermodynamique des composés intermétalliques = Thermodynamics of intermetallic compoundsTUREK, S.Rudy i Metale Nieżelazne. 1985, Vol 30, Num 11, pp 440-443, issn 0035-9696Article

Role of impurity elements in metal-metal bond strengths = Rôle des éléments d'impuretés dans les forces de liaison métal-métalSAQI, M. A. S; PETTIFOR, D. G.Philosophical magazine letters. 1987, Vol 56, Num 6, pp 245-250, issn 0950-0839Article

Peculiarities in the behaviour of sulphidic melts of iron, cobalt and nickel at high temperaturesBRYUKVIN, V.A; KAPUSTIN, O.A; TSYBIN, O.I et al.Izvestiâ Akademii nauk SSSR. Metally. 1984, Vol 1984, Num 3, pp 67-70, issn 0568-5303Article

Effects of corner position and operating condition on electromigration failure in angled bamboo lines without passivation layerSASAGAWA, K; HASEGAWA, M; NAITO, K et al.Thin solid films. 2001, Vol 401, Num 1-2, pp 255-266, issn 0040-6090Article

Surface condition effects of the inter-metal dielectrics on interconnect aluminum film propertiesKIM, Sam-Dong; RHEE, Jin-Koo; HWANG, In-Seok et al.Thin solid films. 2001, Vol 401, Num 1-2, pp 273-278, issn 0040-6090Article

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